Wafer chip standalone dynamic characteristic testing device
This is a dynamic characteristic testing device for measuring power devices in chip form. There are also many proven inspection devices for testing in wafer form.
This is a dynamic characteristic measurement device (AC characteristic measurement device) aimed at individual wafer chips of various semiconductors (IGBT, P-MOS FET, SiC, GaN, Diodes, etc.). It enables dynamic characteristic testing during shipping inspections and acceptance inspections of individual chips, as well as during the process before package sealing.
- Company：コペル電子
- Price：Other
